I am using Perkin Elmer NexION 300X ICP-MS for analysis purpose and have below given doubts:
1. How often is Platinum cone cleaning required of heavy matrix samples?
2. What are the acceptable counts for Be, Mg, In, U and CeO in daily performance test for HF resistant spray chembar?
3. What method/calibration range can be tried for Silicon analysis as good calibration curve (R^2 less than 0.5) is observed for calibration range of 1to 50 ppb?
4. How often Quadrapole rodd offset and Cell rod offset needs to be optimized?