"In February 2007, the FEI previewed the educational version of its newly-developed Phenom microscope, the world's first tabletop scanning electron microscope (SEM) designed specifically for education, to U.S. Congressional members. Magnifying up to 20,000x -- or 20x the range of traditional optical microscopes -- this technology will give students access to micro- and nanoscale worlds rarely seen in undergraduate and high school studies.

Citing that nanotechnology is expected to make a significant impact across industries in the competitive global economy, the Commerce Department's Technology Administration saluted FEI with the Recognition of Excellence in Innovation for "creating a remarkable tool that will bring a new teaching dimension to the classroom; foster interest in advanced science, technology, engineering and math education; inspire future scientists and innovators; and increase U.S. competitiveness.""

Quoted from: Nanotech Wire